CV / IV Analysis system

MDC Europe provides a complete line of systems & software for wide range of device characterization: CV (capacitance voltage), IV (current voltage), conductance, gate integrity, doping & resistivity profiles, mobile ion concentration (TVS) and more. Customizable with different probes, a wide range of meters (Agilent, Keithley, HP) as well as modulable, complete & powerful analysis software packages. Ideal for monitoring critical processing steps for contamination and material quality as well as research purposes.

Measurement Technologies

Mercury Probe Systems

Used for non-destructive C-V, I-V and sheet resistance characterization in R&D and process development environments where permanent metallization is not desirable. Well suited for rapid characterization, materials research and early-stage device evaluation and the analysis of furnace contaminants.

Hot Chuck Wafer Probers (QuietChuck)

Temperature-controlled wafer probing solutions enabling stable electrical measurements under defined thermal conditions. Ideal for temperature-dependent C-V / I-V analysis and advanced characterization workflows. These systems are also ideally suited for mobile-ion monitoring, delivering consistent performance in demanding test environments.

Typical Applications

Semiconductor R&D and device characterization
Doping profile and junction analysis
Leakage current and breakdown testing
Process development and optimization

Why MDC Europe?

MDC Europe combines expertise in semiconductor metrology with flexible system configurations and strong application support. Our C-V / I-V analysis solutions are designed to meet the requirements of advanced research and development environments.

Why to Choose Our Products?

OEM-level refurbishment meeting original specifications
30+ years of experience in semiconductor solutions
Fast European delivery and support
Comprehensive product portfolio from spares to systems
Trusted by leading OEMs and research institutes