Probe tips are consumable contacts used in four-point probe, resistivity measurement, CV/IV and parametric test systems. Tip material and geometry directly affect contact quality, measurement accuracy and wafer surface integrity.

MDC Europe supplies a range of probe tips in multiple materials and geometries, configured for standard probe holders and semiconductor measurement platforms. Tips are supplied 5 per box. All probes have a shaft diameter of 0.020″ to 0.025″ and fit standard probe holders, except Model 896-PRB-01 which requires a special retractable holder.

Probe Tip Selection Criteria

Probe tips are selected based on:

contact material and tip radius suited to the wafer surface
current requirements and contact resistance constraints
compatibility with the probe holder and measurement system

Probe Tips Portfolio

MDC Europe provides probe tips including:

PSE-T — Tungsten, standard general purpose, 5 µm tip
PSE-GA — Flexible tungsten, 0.5 µm tip radius, contact retention
PSE-TB — Tungsten blunt, general purpose, 25 µm tip
PSE-O — Osmium, low contact resistance, 12 µm tip radius
PSE-S — Steel, very hard, poly contact
PSE-TC — Tungsten carbide, very hard, 10 µm tip radius
PSE-P — Palladium, low contact resistance
PSE-CW — Tungsten “cat whisker”, clean metal contact only
PSE-BC — Beryllium copper, high current, 12 µm tip radius
896-PRB-01 — Tungsten retractable, spring-loaded, 0.002″ diameter tip

MDC Europe Capability

MDC Europe supports probe tip selection aligned with measurement platform requirements, ensuring contact compatibility and measurement repeatability across resistivity, CV/IV and parametric test applications.

Why to Choose Our Products?

OEM-level refurbishment meeting original specifications
30+ years of experience in semiconductor solutions
Fast European delivery and support
Comprehensive product portfolio from spares to systems
Trusted by leading OEMs and research institutes